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SIwave和HFSS在过孔建模方面有什么区别？
在做过孔的S参数提取时，SIwave和HFSS各有什么优势和局限性？什么场景下应该选择哪个工具？
SIwaveHFSS过孔建模
仿真工程师2026-08-154566Answer
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High-frequency discrepancies are typically caused by the following: 1 Material parameters (Dk/Df) not accurately modeled for frequency dependence; 2 Conductor surface roughness model not enabled; 3 Inconsistent port calibration reference planes. First, verify material settings and enable the Huray roughness model, then compare simulated and measured group delay.
Senior Engineer2026-08-19
Additionally, verify that the mesh is sufficiently fine. At high frequencies, the skin depth decreases, so ensure there are at least 3 to 4 mesh layers across the conductor cross-section. Also, placing radiation boundaries too close to conductors can introduce errors.
Simulation Expert2026-08-19
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